AFM

Atomic-force microscopy

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http://www.afmuniversity.org/


Atomic Force Microscopy
http://www.doitpoms.ac.uk/tlplib/afm/index.php



https://nanohub.org/
Fundamentals of Atomic Force Microscopy
http://nanohub.org/resources/7320

http://www.lapshin.fast-page.org/gallery.htm

 http://www.eng.utah.edu/~lzang/images/Lecture_10_AFM.pdf

http://www.nanoscience.gatech.edu/zlwang/research/highlights.html

http://www.budgetsensors.com/

13 May 2016


Van der Waals interactions and the limits of isolated atom models at interfaces



(a) Schematic drawing of the AFM measurement set-up. (b) Chemical structure
of Cu-coordinated molecular network on Cu(111); the 2 symmetry-inequivalent
nodal sites are indicated as i and ii. (c) STM topographies before and after the
vertical manipulation of a Xe atom. (d) Distance-dependent curve of the
tunnelling current in the process. Measurement parameters: I=2 pA and V=200
mV in c, and V=2 mV in d. Scale bar, 1 nm.



(a) STM topography and (b) AFM images taken with a Xe-functionalized tip  and
(c) a CO-functionalized tip. The two symmetry-inequivalent nodal sites are
indicated as i and ii;the five-membered C3N2 of the 3deh-DPDI exo-ligands are
indicated by a white arrow. Measurement parameters: I=2 pA and V=−200 mV
in a, and A=60 pm and V=0 mV in b,c. Scale bar, 1 nm.

http://www.nature.com/ncomms/2016/160513/ncomms11559/fig_tab/ncomms11559_ft.html